Standard

BS ISO 15932:2013

Microbeam analysis. Analytical electron microscopy. Vocabulary

Current, Under Review

•

Published:

31 Dec 2013

0 Scope

This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order.

This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

NOTE See also the ISO online browsing platform (OBP): https://www.iso.org/obp/ui/

Product Details

Descriptors

Optical instruments

Electron optics

Instrumental methods of analysis

Microscopes

Vocabulary

Electron beams

Electron microscopes

Scanning electron microscopes

Terminology

ICS Codes

01.040.37 Image technology (Vocabularies)

37.020 Optical equipment

Committee

CII/9

International relationships

Identical to:

ISO 15932:2013

ISBN

978 0 580 75210 0

Publisher

BSI