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ISO 15932:2013 | 15 Dec 2013 | BSI Knowledge
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ISO 15932:2013
Microbeam analysis. Analytical electron microscopy. Vocabulary
Current, Under Review
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Published:
15 Dec 2013
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Product Details
Descriptors
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ICS Codes
01.040.37 Image technology (Vocabularies)
37.020 Optical equipment
Committee
CII/9
International relationships
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ISBN
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Publisher
ISO