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BS ISO 25498:2018 - TC | 31 Mar 2018 | BSI Knowledge
Standard
Withdrawn
BS ISO 25498:2018
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Published:
31 Mar 2018
•
Withdrawn:
16 May 2025
Overview
Preview
References
History
Product Details
Descriptors
Chemical analysis and testing
Electron diffraction
Spectroscopy
Test specimens
Microanalysis
Crystal lattices
Electron microscopes
Electron beams
Optical instruments
ICS Codes
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:
ISO 25498:2018
ISBN
978 0 580 94692 9
Publisher
BSI