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ISO 25498:2018 | 16 Mar 2018 | BSI Knowledge
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ISO 25498:2018
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Published:
16 Mar 2018
•
Withdrawn:
15 May 2025
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Product Details
Descriptors
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ICS Codes
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
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ISBN
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Publisher
ISO