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BS EN 15991:2011 | 28 Feb 2011 | BSI Knowledge
Standard
Withdrawn
BS EN 15991:2011
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Published:
28 Feb 2011
•
Withdrawn:
30 Nov 2015
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Product Details
Descriptors
Particulate materials
Silicon inorganic compounds
Vaporization
Emission spectrophotometry
Ceramics
Determination of content
Trace element analysis
Impurities
Carbides
Chemical analysis and testing
Refractory materials
Raw materials
ICS Codes
81.060.10 Raw materials
Committee
RPI/1
International relationships
Identical to:
EN 15991:2011
ISBN
978 0 580 64180 0
Publisher
BSI