National foreword

This British Standard is the UK implementation of IEC 62860‑1:2013.

The UK participation in its preparation was entrusted to Technical Committee NTI/1, Nanotechnologies.

A list of organizations represented on this committee can be obtained on request to its secretary.

This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.

Compliance with a British Standard cannot confer immunity from legal obligations.

This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 August 2014.

WARNING! — Make sure that you obtained this publication from an authorized distributor.

FOREWORD

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International Standard IEC 62860‑1/IEEE Std 1620.1™-2006 has been processed through IEC technical committee 113: Nanotechnology standardization for electrical and electronic products and systems, under the IEC/IEEE Dual Logo Agreement.

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A bilingual version of this standard may be issued at a later date.

Abstract:Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.

Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator

IEEE Introduction

This introduction is not part of IEEE Std 1620.1-2006, IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators.

This standard covers recommended methods and standardized reporting practices for electrical characterization of organic transistor-based ring oscillators. Due to the nature of organic transistors and circuitry, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error and gives recommended practices in order to minimize and/or characterize the effect of each.

Standard reporting practices are included in order to minimize confusion in analyzing reported data. Disclosure of environmental conditions and design-of-experiment are included so that results can be appropriately assessed by the research community. These reporting practices also support repeatability of results, so that new discoveries may be confirmed more efficiently.

The practices in this standard were compiled from research and industry organizations developing organic transistor devices, materials, circuitry, and manufacturing techniques. These practices are based on standard operating procedures utilized in laboratories worldwide.

The development of this standard was initiated in 2004 to facilitate the evolution of organic transistor circuitry from the laboratory into a sustainable industry. Standardized characterization methods and reporting practices create a means of effective comparison of information and a foundation for manufacturing readiness.

Notice to users

Errata

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Interpretations

Current interpretations can be accessed at the following URL: http://standards.ieee.org/http://standards.ieee.org/reading/ieee/interp/index.html.

Patents

Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention.

1 Overview

1.1 Scope

This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

1.2 Purpose

1.3 Electrical characterization overview

2 Definitions, abbreviations and acronyms

2.1 Definitions

2.2 Acronyms

3 Standard ring oscillator characterization procedures

3.1 Circuit layout

3.2 Guidelines for the ring oscillator characterization process

3.3 Other applicable standards

3.4 Reporting data

3.5 Environmental control and standards

BS IEC 62860-1:2013

Test methods for the characterization of organic transistor-based ring oscillators

Current

Published:

31 Aug 2014