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ISO 14701:2011 | 1 Aug 2011 | BSI Knowledge
Standard
Withdrawn
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ISO 14701:2011
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Published:
1 Aug 2011
•
Withdrawn:
31 Oct 2018
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Product Details
Descriptors
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ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO