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ISO 14701:2018 | 31 Oct 2018 | BSI Knowledge
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ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Current, Under Review
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Published:
31 Oct 2018
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Product Details
Descriptors
Chemical analysis and testing
Optical chemical analysis
Silicones
X-ray therapy
Chemical tests
ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO