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BS ISO 15470:2004 | 31 Mar 2005 | BSI Knowledge
Standard
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BS ISO 15470:2004
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Published:
31 Mar 2005
•
Withdrawn:
31 Mar 2017
Overview
Preview
References
History
1 Scope
This International Standard describes the way in which specific aspects of the performance of an X-ray photoelectron spectrometer shall be described.
Product Details
Descriptors
Surface chemistry
Properties
Photoelectron spectroscopy
Test equipment
Surfaces
Electron emission
Spectroscopy
Instrumental methods of analysis
Chemical analysis and testing
X-ray photoelectron spectroscopy
ICS Codes
71.040.40 Chemical analysis
Committee
—
International relationships
Identical to:
ISO 15470:2004
ISBN
0 580 45712 5
Publisher
BSI