ISO/TS 18507 discusses surface chemical analysis. ISO/TS 18507 provides a framework on the uses of Total Reflection X-Ray Fluorescence (TXRF) spectroscopy for elemental qualitative and quantitative analysis of biological and environmental samples.
ISO/TS 18507 is meant to help to understand the possible uses of TXRF for elemental analysis by providing the guidelines for the characterization of biological and environmental samples with TXRF spectroscopy.
ISO/TS 18507 on surface chemical analysis is useful for:
Total Reflection X-Ray Fluorescence (TXRF) spectroscopy is a reliable technique for chemical analysis. TXRF today is employed in electronic industry quality control. TXRF is also a powerful multi-elemental method for trace and ultra-trace analysis of different kinds of samples that can be grouped. Because of its capability to analyse different kinds of samples, TXRF is suitable for chemical metrology at the nanoscale, both for heavy metals and light elements in environmental and biological analysis.
ISO/TS 18507 provides guidelines for the characterization of biological and environmental samples with TXRF spectroscopy. It includes the following: (a) description of the relevant terms (b) sample preparation (c) experimental procedure (d) discussions on data analysis and result interpretation (e) uncertainty (f) case studies and (g) references. ISO/TS 18507 also provides you with the advantages of TXRF spectroscopy. ISO/TS 18507 helps you in a better understanding of possible uses of TXRF for elemental analysis.
ISO/TS 18507:2015