Standard

BS ISO 20341:2003

Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials

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This part of ISO 3262 specifies the requirements and the corresponding methods of test for natural quartz (ground).

Product Details

Descriptors

Mass spectrometry

Statistical methods of analysis

Spectroscopy

Normal distribution

Surface chemistry

Chemical analysis and testing

Damping coefficient

Depth measurement

Surface properties

Test methods

Mathematical calculations

Secondary

Ions

Depth

ICS Codes

71.040.40 Chemical analysis

Committee

CII/60

International relationships

Identical to:

ISO 20341:2003

ISBN

0 580 42439 1

Publisher

BSI