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ISO 22415:2019 | 10 May 2019 | BSI Knowledge
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ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
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Published:
10 May 2019
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Product Details
Descriptors
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ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO