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ISO 14237:2000 | 1 Feb 2000 | BSI Knowledge
Standard
Withdrawn
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ISO 14237:2000
Surface chemical analysis. Secondary ion mass spectrometry. Determination of atomic boron content in silicon using uniformly doped materials
Published:
1 Feb 2000
•
Withdrawn:
9 Jul 2010
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Product Details
Descriptors
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ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO