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ISO 21222:2020 | 29 Jan 2020 | BSI Knowledge
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ISO 21222:2020
Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Published:
29 Jan 2020
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Product Details
Descriptors
Surfaces
Analysis
Probes
Elastic moduli
Microscopes
ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO