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ISO 23170:2022 | 15 Jun 2022 | BSI Knowledge
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ISO 23170:2022
Surface chemical analysis --- Depth profiling - Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
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Published:
15 Jun 2022
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Product Details
Descriptors
Control surfaces
Testing
Chemical methods of analysis
Chemical tests
Laboratories (chemical)
Reactions (chemical)
ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO