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ISO 16531:2013 | 1 Jun 2013 | BSI Knowledge
Standard
Withdrawn
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ISO 16531:2013
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
Published:
1 Jun 2013
•
Withdrawn:
5 Oct 2020
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Product Details
Descriptors
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ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO