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ASTM F76 - 08(2016)e1 | 1 May 2016 | BSI Knowledge
Standard
Withdrawn
ASTM F76 - 08(2016)e1
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Published:
1 May 2016
•
Withdrawn:
6 Dec 2023
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Product Details
Descriptors
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ICS Codes
29.045 Semiconducting materials
Committee
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International relationships
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ISBN
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Publisher
ASTM