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ASTM F996 - 11(2018) | 1 Mar 2018 | BSI Knowledge
Standard
Withdrawn
ASTM F996 - 11(2018)
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics
Published:
1 Mar 2018
•
Withdrawn:
6 Dec 2023
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ICS Codes
31.080.30 Transistors
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ASTM