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ASTM E2534 - 20 | 1 Dec 2020 | BSI Knowledge
Standard
Withdrawn
ASTM E2534 - 20
Standard Practice for Targeted Defect Detection Using Process Compensated Resonance Testing Via Swept Sine Input for Metallic and Non-Metallic Parts
Published:
1 Dec 2020
•
Withdrawn:
17 Jul 2025
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Descriptors
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ICS Codes
17.160 Vibrations, shock and vibration measurements
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ISBN
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Publisher
ASTM