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ASTM E1161 - 09(2014) | 6 Jan 2014 | BSI Knowledge
Standard
Withdrawn
ASTM E1161 - 09(2014)
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
Published:
6 Jan 2014
•
Withdrawn:
8 Jul 2021
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Product Details
Descriptors
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ICS Codes
19.100 Non-destructive testing
31.080.01 Semiconductor devices in general
Committee
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International relationships
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ISBN
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Publisher
ASTM