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ASTM E431 - 96(2016) | 1 Jun 2016 | BSI Knowledge
Standard
Withdrawn
ASTM E431 - 96(2016)
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Published:
1 Jun 2016
•
Withdrawn:
20 Oct 2022
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Product Details
Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
77.040.20 Non-destructive testing of metals
Committee
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ISBN
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Publisher
ASTM