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ASTM F1192 - 11 | 10 Jan 2011 | BSI Knowledge
Standard
Withdrawn
ASTM F1192 - 11
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Published:
10 Jan 2011
•
Withdrawn:
22 May 2018
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Product Details
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ICS Codes
31.080.01 Semiconductor devices in general
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ISBN
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Publisher
ASTM