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ASTM F1192 - 24 - TC | 1 May 2024 | BSI Knowledge
Standard
ASTM F1192 - 24
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
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Published:
1 May 2024
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ICS Codes
31.080.01 Semiconductor devices in general
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ASTM