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ASTM E1438 - 11(2019) | 1 Nov 2019 | BSI Knowledge
Standard
ASTM E1438 - 11(2019)
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
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Published:
1 Nov 2019
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Descriptors
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ICS Codes
29.045 Semiconducting materials
71.040.50 Physicochemical methods of analysis
Committee
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International relationships
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ISBN
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Publisher
ASTM