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ASTM F1892 - 12(2018) | 1 Mar 2018 | BSI Knowledge
Standard
Withdrawn
ASTM F1892 - 12(2018)
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Published:
1 Mar 2018
•
Withdrawn:
17 Jul 2026
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Product Details
Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
Committee
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ISBN
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Publisher
ASTM