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ASTM F1263 - 11(2019) | 1 Dec 2019 | BSI Knowledge
Standard
Withdrawn
ASTM F1263 - 11(2019)
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Published:
1 Dec 2019
•
Withdrawn:
13 Feb 2025
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Product Details
Descriptors
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ICS Codes
31.020 Electronic components in general
Committee
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International relationships
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ISBN
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Publisher
ASTM