BS IEC 61671-2 is the second part of the BS IEC 61671 multi-series that discusses automatic test markup language (ATML).
BS IEC 61671-2 defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models and the specific description of instrument instance information.
BS IEC 61671-2 on ATML instrument description is useful for:
XML schemas define the basic information required within any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and providing several methods within each to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment.
BS IEC 61671-2 provides for the definition of the Instrument Description and Instrument Instance XML schemas, and contains references to examples. These XML schemas and examples accompany BS IEC 61671-2 and provide for the identification and definition of an instrument.
Identifying an instrument provides for the unambiguous specification of a particular instrument. This unambiguous specification shall be readable to both, you and the machines. You can use the specification to identify and assemble the instrument into their test application. Machines can use the specification to verify that the testing need can be accomplished by the instrument in place.
IEC 61671-2:2016