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ISO 12179:2000 | 15 Mar 2000 | BSI Knowledge
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ISO 12179:2000
Specification for the methodolgy for surface metrology calibration and verification for surface profiling instruments
Current, Under Review
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Published:
15 Mar 2000
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Product Details
Descriptors
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ICS Codes
17.040.30 Measuring instruments
Committee
TPR/1
International relationships
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ISBN
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Publisher
ISO