1 Scope
This part of CISPR 16‑4 specifies the method of applying Measurement Instrumentation Uncertainty (MIU) when determining compliance with CISPR disturbance limits. The material is also relevant to any EMC test when interpretation of the results and conclusions reached will be impacted by the uncertainty of the measurement instrumentation used during testing.
NOTE In accordance with IEC Guide 107, CISPR 16‑4‑2 is a basic EMC standard for use by product committees of the IEC. As stated in Guide 107, product committees are responsible for determining the applicability of the EMC standard. CISPR and its sub-committees are prepared to co-operate with technical committees and product committees in the evaluation of the applicability of this standard for specific products.
The annexes contain the background material used in providing the amount of MIU found in generating the CISPR values shown in Clauses 4 through 8 and hence provide valuable background material for those needing both initial and further information on MIU and how to take individual uncertainties in the measurement chain into account. The annexes, however, are not intended to be a tutorial or user manual or to be copied when making uncertainty calculations. For that purpose, the references shown in the bibliography, or other widely recognized documents, may be used.
Measurement instrumentation specifications are given in the CISPR 16‑1 series, while the methods of measurement are covered in the CISPR 16‑2 series. Further information and background on CISPR and radio disturbances is given in CISPR 16‑3. The other parts of the CISPR 16‑4 series contain further information on uncertainties in general, statistics and limit modelling. See the introduction of this part for more information on the background and on the content of the CISPR 16‑4 series.