Search BSI Knowledge
Cookie Settings
BS EN 62374:2007 | 31 Oct 2008 | BSI Knowledge
Standard
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Current, Under Review
•
Published:
31 Oct 2008
Overview
Preview
References
History
Visit the preview section for more information
Product Details
Descriptors
Mathematical calculations
Electrical measurement
Semiconductor devices
Testing conditions
Semiconductors
Films (states of matter)
Dielectric breakdown
Life (durability)
ICS Codes
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
EN 62374:2007
IEC 62374:2007
ISBN
978 0 580 54048 6
Publisher
BSI