BS EN IEC 62969 is an international standard that discusses semiconductor devices. The main objective of the BS EN IEC 62969 series is to ensure semiconductor interfaces offer the required level of performance for optimal operational efficiency of the end-application.
BS EN IEC 62969-4 is the fourth part of the multi-series that specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
BS EN IEC 62969-4 on semiconductor interface for automotive vehicles is useful for:
Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function.
BS EN IEC 62969‑4 provides guidance on evaluation and tests, disturbances test conditions, test conditions, and configurations, fault injection. As a result, you are introduced to new possibilities for the analysis of data interface errors and techniques for improving the coverage of a test by introducing faults to the device under test.
With data interface-specific trigger conditions and time synchronization, BS EN IEC 62969‑4 can help you to find the causes of protocol errors much quicker than with a traditional test method.
EN 60893-3-7:2004/A1:2009
IEC 62969-4:2018
EN IEC 62969-4:2018