Standard

BS IEC 60747-5-18:2026

Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

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Product Details

Descriptors

Semiconductor technology

Semiconductor devices

Optoelectronic devices

Light-emitting diodes

Testing methods

Luminescence

Epitaxial layers

ICS Codes

31.080.99 Other semiconductor devices

Committee

EPL/47

International relationships

Identical to:

IEC 60747-5-18 ED1

ISBN

978 0 539 31360 4

Publisher

BSI