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BS IEC 62047-40:2021 | 30 Sep 2021 | BSI Knowledge
Standard
BS IEC 62047-40:2021
Semiconductor devices. Micro-electromechanical devices - Test methods of micro-electromechanical inertial shock switch threshold
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Published:
30 Sep 2021
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Product Details
Descriptors
Test methods
Semiconductor technology
Electronic equipment and components
Electromechanical devices
Semiconductor devices
Integrated circuits
ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
IEC 62047-40 Ed.1.0
ISBN
978 0 539 07033 0
Publisher
BSI