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BS IEC 62047-44:2024 | 29 Feb 2024 | BSI Knowledge
Standard
BS IEC 62047-44:2024
Semiconductor devices. Micro-electromechanical devices - Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
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Published:
29 Feb 2024
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Product Details
Descriptors
Electric fields
Resonant frequency
Performance
Performance testing
Testing methods
Electromechanical devices
Semiconductor devices
Semiconductor technology
ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
IEC 62047-44:2024
ISBN
978 0 539 21848 0
Publisher
BSI