Standard

BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices - Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

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Product Details

Descriptors

Semiconductor manufacture

Semiconductor technology

Electromechanical storage

Bend testing

Testing methods

Characteristics

Performance characteristics

ICS Codes

31.080.99 Other semiconductor devices

Committee

EPL/47

International relationships

Identical to:

IEC 62047-43 Ed.1.0

ISBN

978 0 539 17665 0

Publisher

BSI