BS EN 62047-11 is the 11th part of an international standard used for Semiconductor devices.
BS EN 62047-11 specifies the test method to measure the linear thermal expansion coefficients (CLTE) of thin free-standing solid (metallic, ceramic, polymeric, etc.) microelectromechanical system (MEMS) materials with the length between 0,1 mm and 1 mm and width between 10 μm and 1 mm and thickness between 0,1 μm and 1 mm, which are main structural materials used for MEMS, micromachines and others. This test method is applicable for the CLTE measurement in the temperature range from room temperature to 30 % of a material’s melting temperature.
BS EN 62047-11 on Linear thermal expansion of free-standing materials used in micro-electromechanical systems is useful for:
Micro-electromechanical systems (MEMS) are a process technology that is useful in creating tiny integrated devices or systems. These devices are useful in combining mechanical and electrical components.
BS EN 62047-11 specifies the test requirements, test methods, and test procedure for measuring the linear thermal expansion of free-standing materials used in micro-electromechanical systems. The test methods are as follows:
By applying BS EN 62047-11 you can ensure the sustainability of these free-standing materials in different climatic conditions. This result in manufacturing good quality free-standing materials that are used in micro-electromechanical systems.
EN 62047-11:2013
IEC 62047-11:2013