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BS EN 62047-8:2011 | 30 Jun 2011 | BSI Knowledge
Standard
BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices - Strip bending test method for tensile property measurement of thin films
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•
Published:
30 Jun 2011
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Product Details
Descriptors
Electronic equipment and components
Bend testing
Semiconductor technology
Strips
Test equipment
Tensile testing
Electromechanical devices
Test specimens
Thin films
Semiconductor devices
Integrated circuits
ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
EN 60512-13-1:2006
EN 62047-8:2011
IEC 62026-3:2014/COR1:2015
IEC 62047-8:2011
ISBN
978 0 580 60629 8
Publisher
BSI