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BS EN 62418:2010 | 31 Aug 2010 | BSI Knowledge
Standard
BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Current
•
Published:
31 Aug 2010
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Product Details
Descriptors
Aluminium
Diffusion
Stress
Electrical measurement
Copper
Metals
Surfaces
Semiconductor devices
Electronic equipment and components
Visual inspection (testing)
Semiconductors
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
EN 62418:2010
IEC 62418:2010
ISBN
978 0 580 62610 4
Publisher
BSI