BS EN IEC 60749-12:2018

What is BS EN IEC 60749-12 - Variable frequency vibration of semiconductor devices about?   

BS EN IEC 60749 is an international standard on semiconductor devices.  

BS EN IEC 60749-12 is the 12th part in the multi-series that describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This test method describes a swept sine test. 

BS EN IEC 60749-12 is normally applicable to cavity-type packages. 

Who is BS EN IEC 60749-12 - Variable frequency vibration of semiconductor devices for?  

BS EN IEC 60749-12 on variable frequency vibration is relevant to:  

• Semiconductor device manufacturers 
• Manufacturer of electronic devices  
• Product design engineers 
• Automobile industry 
• Electrical engineers 
• Fabricators 

Why should you use BS EN IEC 60749-12 - Variable frequency vibration of semiconductor devices?   

Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function. 

The test methods provided under BS EN IEC 60749-12 helps you to avoid any mechanical damage such as cracking, chipping, or breaking that leads to overall product/application failure.  

BS EN IEC 60749‑12 also helps identify failures if the parametric limits are exceeded or if functionality cannot be demonstrated under nominal and worst-case conditions.  

Overall, BS EN IEC 60749‑12 can help identify and mitigate effects of undue vibration, minimize fatigue, and maintain operational efficiency and service-life of the end-application.  

What’s changed since the last update?  

BS EN IEC 60749-12:2018 supersedes BS EN 60749-12:2002, which is withdrawn. BS EN IEC 60749-12:2018 includes some technical changes with respect to BS EN 60749-12:2002. This includes:  

• Alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.