BS EN 60749-6:2017

What is BS EN IEC 60749-6 - Storage at high temperatures of semiconductor devices about?    

BS EN IEC 60749 is an international standard covering storage at high temperatures of semiconductor devices, facilitating the operability and performance in electronic applications. 

The purpose of BS EN 60749-6 is to test and determine the effect on all-solid-state electronic devices of storage at elevated temperatures without electrical stress applied. 

BS EN 60749-6 test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure methods and time-to-failure of solid-state electronic devices, including non-volatile memory devices. 

BS EN 60749-6 is considered non-destructive but should preferably be used for device qualification. If such devices are used for delivery, the effects of this highly accelerated stress test will need to be evaluated. 

Note: Thermally activated failure mechanisms are modelled using the Arrhenius equation for acceleration and guidance on the selection of test temperatures and durations can be found in IEC 60749-43. 

Who is BS EN 60749-6 - Storage at high temperatures of semiconductor devices for?   

BS EN 60749-6 on storage at high temperatures is relevant to:   

• Semiconductor device manufacturers 
• Dealers and importers of semiconductor devices 
• Manufacturer of electronic devices 
• Product design engineers 
• Automobile industry 
• Electrical engineers 

Why should you use   BS EN 60749-6 - Storage at high temperatures of semiconductor devices?    

Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function. They are usually made of semiconductor materials such as silicon, germanium, and gallium arsenide for their function. 

The test methods provided under BS EN 60749-6 helps you to assess and prevent any mechanical damage such as cracking, chipping, or breaking that leads to overall product/application failures. A device will be considered a high-temperature storage failure if parametric limits are exceeded, or if functionality cannot be demonstrated under nominal and worst-case conditions, specified in the relevant procurement BS EN 60749-6. 

Overall, BS EN 60749-6 can help you to minimize the release of contamination, degradation due to corrosion and other mechanisms and maintain operational efficiency and the service life of the end application.   

What’s changed since the last update?   

BS EN 60749-6:2017 supersedes BS EN 60749‑6:2002, which is withdrawn.   BS EN 60749-6:2017 includes some technical changes with respect to BS EN 607496:2002. This includes:   

• Additional test conditions 
• Clarification of the applicability of test conditions