Standard

BS EN IEC 60749-5:2024

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test

Current

•

Published:

29 Feb 2024

1 Scope

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This test method is considered destructive.

Product Details

Descriptors

Humidity

Temperature

Mechanical testing

Test methods

Semiconductor devices

ICS Codes

31.080.01 Semiconductor devices in general

Committee

EPL/47

International relationships

Identical to:

IEC 60749-5 Ed.3.0

EN 60749-5 Ed.3.0

ISBN

978 0 539 23216 5

Publisher

BSI