BS EN IEC 60749 is an international standard on semiconductor devices.
BS EN IEC 60749-13 is the 13th part of the series that describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces.
BS EN IEC 60749-13 is only applicable to those devices specified for a marine environment.
BS EN IEC 60749-13 on salt atmosphere test is relevant to:
Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function.
BS EN IEC 60749-13 provides guidance on how to address failure criteria such as pinholes, pitting, blistering, flaking, corrosion product that fully crosses the lead, or any indication of pinholes, pitting, blistering, flaking, corrosion product, or corrosion stain at the glass seal.
As a consequence, it makes it easier to settle fog and prevents corrosion products and condensate from one specimen from falling onto another. You can thus avoid pressure build-up and ensure that salt fog is distributed evenly.
BS EN IEC 60749-13:2018 supersedes BS EN 60749-13:2002, which is withdrawn. BS EN IEC 60749-13:2018 includes the following technical change with respect to BS EN 60749-13:2002:
EN IEC 60749-13:2018
IEC 60749-13:2018