Search BSI Knowledge
Cookie Settings
BS EN 60749-15:2010 | 28 Feb 2011 | BSI Knowledge
Standard
Withdrawn
BS EN 60749-15:2010
Semiconductor devices. Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices
Published:
28 Feb 2011
•
Withdrawn:
1 Oct 2020
Overview
Preview
References
History
Visit the preview section for more information
Product Details
Descriptors
Soldering
Environmental testing
Solderability testing
Slots
Destructive testing
Semiconductor devices
Encapsulated
Holes
Integrated circuits
Climate
Thermal testing
Electronic equipment and components
Mechanical testing
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
EN 60749-15:2010/AC:2011
IEC 60749-15:2010
ISBN
978 0 580 74712 0
Publisher
BSI