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BS EN 60749-30:2005+A1:2011 | 27 Jan 2006 | BSI Knowledge
Standard
Withdrawn
BS EN 60749-30:2005+A1:2011
Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing
Published:
27 Jan 2006
•
Withdrawn:
30 Sep 2020
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Product Details
Descriptors
Semiconductor devices
Electronic equipment and components
Mechanical testing
Performance testing
Specimen preparation
Environmental testing
Reliability
Climate
Surface mounting devices
Integrated circuits
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
EN 60749-30:2005/A1:2011
IEC 60749-30:2005
IEC 60749-30:2005/AMD1:2011
ISBN
978 0 580 68749 5
Publisher
BSI