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IEC 60749-37:2022 ED2 | 12 Oct 2022 | BSI Knowledge
Standard
IEC 60749-37:2022 ED2
Semiconductor devices. Mechanical and climatic test methods. - Part 37: Board level drop test method using an accelerometer
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Published:
12 Oct 2022
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Product Details
Descriptors
Semiconductor devices
Semiconductors
Electronic components
Printed-circuit boards
Electrical failure
Failure analysis
Testing
Reports
Accelerometers
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
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ISBN
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Publisher
IEC