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IEC 60749-34-1:2025 | 20 Jun 2025 | BSI Knowledge
Standard
IEC 60749-34-1:2025
Semiconductor devices. Mechanical and climatic test methods. - Part 34-1: Power cycling test for power semiconductor module
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Published:
20 Jun 2025
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Product Details
Descriptors
Electronic equipment and components
Semiconductor devices
Testing methods
Power rating
Heat treatment
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
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ISBN
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Publisher
IEC