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IEC 60749-10:2022 | 27 Apr 2022 | BSI Knowledge
Standard
IEC 60749-10:2022
Semiconductor devices - Mechanical and climatic test methods - - Part 10: Mechanical shock - device and subassembly
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Published:
27 Apr 2022
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Product Details
Descriptors
Semiconductor storage
Mechanical shock
Testing methods
Test methods
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
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ISBN
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Publisher
IEC