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IEC 60749-20-1:2019 | 26 Jun 2019 | BSI Knowledge
Standard
IEC 60749-20-1:2019
Semiconductor devices. Mechanical and climatic test methods - Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
Current
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Published:
26 Jun 2019
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Product Details
Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
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ISBN
978-2-8322-7043-1
Publisher
IEC