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IEC 60749-26:2025 | 23 Dec 2025 | BSI Knowledge
Standard
IEC 60749-26:2025
Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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Published:
23 Dec 2025
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Product Details
Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
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ISBN
978-2-8327-0918-4
Publisher
IEC