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BS EN 60749-26:2006 | 29 Sep 2006 | BSI Knowledge
Standard
Withdrawn
BS EN 60749-26:2006
Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Published:
29 Sep 2006
•
Withdrawn:
30 Jun 2014
Overview
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References
History
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Product Details
Descriptors
Semiconductor devices
Damage
Degradation
Human body
Mechanical testing
Grades (quality)
Electronic equipment and components
Classification systems
Electrostatics
Integrated circuits
Climate
Test models
Environmental testing
Electrical testing
Sensitivity
ICS Codes
29.035.01 Insulating materials in general
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
EN 60749-26:2006
IEC 60749-26:2006
IEC 60893-3-2:2003/AMD1:2011
ISBN
0 580 49295 8
Publisher
BSI